Skip to Content.
Sympa Menu

fizinfo - [Fizinfo] MFA Seminar 2006-02-09 - François CALOZ (Diamond SA, Switzerland) & Loïc CHEREL (Data Pixel Sarl, France)

fizinfo AT lists.kfki.hu

Subject: ELFT HÍRADÓ

List archive

[Fizinfo] MFA Seminar 2006-02-09 - François CALOZ (Diamond SA, Switzerland) & Loïc CHEREL (Data Pixel Sarl, France)


Chronological Thread 
  • From: Hajnal Zoltán <hajnal AT mfa.kfki.hu>
  • To: mfa AT mfa.kfki.hu
  • Cc: naplo AT mfa.kfki.hu
  • Subject: [Fizinfo] MFA Seminar 2006-02-09 - François CALOZ (Diamond SA, Switzerland) & Loïc CHEREL (Data Pixel Sarl, France)
  • Date: Fri, 03 Feb 2006 14:49:29 +0100
  • List-archive: <http://sunserv.kfki.hu/pipermail/fizinfo>
  • List-id: ELFT H&#205;RAD&#211; <fizinfo.lists.kfki.hu>

Dear Colleagues,

The Research Institute for Technical Physics and Materials Science
(MTA MFA) invites you to its Seminar Presentation titled:

Passive Fiber Optical Component Industry:
The Role of Test and Measurements
(see abstract below)

!!! --> This Seminar is out of our normal schedule!

THURSDAY, 9 February 2006,
10:00
Lecture Room (Tanácsterem) of Bldg. 26. of the
KFKI Campus (1121 Konkoly-Thege M. út 29-33.)

Our guest speakers:

François CALOZ, Diamond SA, Switzerland
Loïc CHEREL, Data Pixel Sarl, France

Beside special interest groups working every day on/with optical data
transmission, the core technology of the "information society" may wake
the interest in many of us (phone, web-users!),

so everybody is welcome!

Best Regards
Z. Hajnal (MTA MFA)


Abstract
Diamond is a company with core competence in handling, terminating and
precise positioning of optical fibers as well as in the production,
measurement and testing of passive optical components. Data Pixel
develops and produces measurement equipment to the needs of fiberoptics
market.

The first part of the presentation will be focussed on measurement and
testing, with some illustrative examples of passive optical components.
We will then discuss the importance of measurement equipment calibration
and various techniques that are currently used. The last part of the
presentation will be dedicated to interferometry and surface topology
measurements on optical connectors with life demonstration of a
DAISI-instrument (Digital Automated Interferometer for Surface
Inspection).




  • [Fizinfo] MFA Seminar 2006-02-09 - François CALOZ (Diamond SA, Switzerland) & Loïc CHEREL (Data Pixel Sarl, France), Hajnal Zoltán, 02/03/2006

Archive powered by MHonArc 2.6.19+.

Top of Page